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Title: Extreme learning machine based image classification
Authors: Xu, Jiantao.
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
Issue Date: 2012
Abstract: Extreme Learning Machine (ELM) as a type of generalized single-hidden layer feed-forward networks (SLFNs) has demonstrated its good generalization performance with extreme fast learning speed in many benchmark and real applications. This project further studies the performance of ELM in image classification using two different feature extraction methods. The first method extracts texture features, intensity features from Histogram and features from two types of color space: HSV & RGB. The second method extracts shape features based on Radon transform. The classification performance of ELM is compared with the performance of Support Vector Machines (SVMs). Simulation results show that ELM has better testing accuracy with much less training time on majority cases than SVM for both feature extraction methods. Besides, the parameter tuning process for ELM is much easier than SVM as well.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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