Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/5106
Title: Analysis and characterization of ultra thin SOI MOSFET by MEDICI
Authors: Shin, Chang Yeop.
Keywords: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Issue Date: 2002
Abstract: In this work, the charge coupling, breakdown mechanism and self-heating effect were investigated and identified by two-dimensional and two-carrier device simulation. This work provided comprehensive understanding of unique features of ultrathin SOI MOSFETs and contributed to SOI device modeling and design for future high performance, low power/voltage ICs.
URI: http://hdl.handle.net/10356/5106
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MSE Theses

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