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Title: Effects of varying mechanical deformation on the relationship between microtexture, mesotexture and current percolation in superconductors
Authors: Tan, Thiam Teck.
Keywords: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
Issue Date: 2003
Abstract: In this work, the Electron Backscattered Diffraction technique was employed to obtain the crystallographic orientation distribution, determine the misorientation of grain boundaries and also map the misorientation distribution in Bi-2223 superconductor tapes.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MSE Theses

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