Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/5133
Title: Mechanical characterization and durability of thin-layered structures
Authors: Xu, Xiaojing.
Keywords: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Issue Date: 2003
Abstract: A shaft-loaded blister test has been developed to study the mechanical performance of thin flexible films deposited on rigid substrate and the interfacial adhesion between them. The aim of this work is to develop a systematic approach in designing thinlayered structures for improved durability through well-controlled experiments and theoretical analysis.
URI: http://hdl.handle.net/10356/5133
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MSE Theses

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