Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/54000
Title: Thermal tomography for defect characterization
Authors: Tan, Lun Siang.
Keywords: DRNTU::Engineering
Issue Date: 2013
Abstract: The use of thermography as a non-destructive testing (NDT) method have been growing and expanding exponentially in the recent years. Many professional fields are making use of this NDT technique for defect detection and defect characterization. There are many algorithms that can help to improve the contrast of thermogram images and depth recovery. In this report, the thermographic signal reconstruction (TSR) technique will be explored. TSR capabilities like noise reduction and reduction of memory required to store thermographic data will be examined. An attempt to extend TSR usage to recover information on defect depth will be made. Two approaches will be proposed and analysis will be performed for its reliability. Results indicate that TSR does have the potential in defect depth recovery in specific cases.
URI: http://hdl.handle.net/10356/54000
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Student Reports (FYP/IA/PA/PI)

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