Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/54355
Full metadata record
DC FieldValueLanguage
dc.contributor.authorLiu, Zhuoshi.
dc.date.accessioned2013-06-19T06:19:58Z
dc.date.available2013-06-19T06:19:58Z
dc.date.copyright2013en_US
dc.date.issued2013
dc.identifier.urihttp://hdl.handle.net/10356/54355
dc.description.abstractThis is a joint project with SIMTech. It is mainly focusing on developing a fault diagnose system. The system can be used to solve stochastic and dynamical problems, like bank abnormal transaction detection, operation abnormal event detection and equipment failure event detection. This system firstly takes training data, which is consisted of multi-dimensional input x and output y, and the parameters inside the system learn from the training data by minimizing the differences between predicted value and real output y. Then, the system will take testing data and predict the output using the trained parameters inside the system. Throughout the calculation, “Kernel recursive least square” (KRLS) method acts as the most important part. The KRLS algorithm presents a nonlinear version of the recursive least squares (RLS) algorithm. The algorithm performs linear regression in a high-dimensional feature space induced by a Mercer kernel and can therefore be used to recursively construct minimum mean-squared-error solutions to nonlinear least-squares problems that are frequently encountered in signal processing applications. In a fault diagnose system, the accuracy of prediction is one of the most important part. Thus, in this project, the author will focus on improving the accuracy of the system based on the partially implemented system by the previous student. Besides, the author also enhanced the user interface, to make it more user-friendly.en_US
dc.format.extent67 p.en_US
dc.language.isoenen_US
dc.rightsNanyang Technological University
dc.subjectDRNTU::Engineeringen_US
dc.titleFault diagnose based on pattern recognitionen_US
dc.typeFinal Year Project (FYP)en_US
dc.contributor.supervisorWang Dan Weien_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeBachelor of Engineeringen_US
dc.contributor.organizationA*STAR SIMTechen_US
item.grantfulltextrestricted-
item.fulltextWith Fulltext-
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)
Files in This Item:
File Description SizeFormat 
EB4164-121.pdf
  Restricted Access
2.28 MBAdobe PDFView/Open

Page view(s)

110
Updated on Nov 28, 2020

Download(s) 10

5
Updated on Nov 28, 2020

Google ScholarTM

Check

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.