Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/5541
Title: Applications of automated defects recognition in IC packaging based on ultrasound C-SAM images
Authors: Zhang, Yilu.
Keywords: DRNTU::Engineering::Manufacturing
Issue Date: 2003
Abstract: This thesis describes the development of an automatic defects' recognition system based on image segmentation and wavelet template. Following the literature review and description of the theory, the "Susan" operator and Variational method have been tested to obtain the edge of images and are compared with the results obtained with classical operators in normal and speckle noise conditions. Then two ways to obtain the size and location of defects are obtained by using blob-coloring to process the map obtained by the Variational method.
URI: http://hdl.handle.net/10356/5541
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Theses

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