Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/5574
Title: Development and characterization of PZT thin films
Authors: Zhou, Min.
Keywords: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Issue Date: 2002
Abstract: Fabrication processes and testing of the completed devices were carried out at NTU Micro-Machine Center. X-ray diffraction analysis and the Polarisation-Field (P-E hysteresis loops) of PZT thin film were measured to characterize the film quality and the electrical properties. The process to fabricate the cantilever structure should be optimized to obtain the maximum piezoelectric constants and low residual stress.
URI: http://hdl.handle.net/10356/5574
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Theses

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