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|Title:||Low power SRAM-PUF with improved reliability & uniformity utilizing aging impact for security improvement||Authors:||Garg, Achiranshu||Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems||Issue Date:||2013||Source:||Garg, A. (2013). Low power SRAM-PUF with improved reliability & uniformity utilizing aging impact for security improvement. Master’s thesis, Nanyang Technological University, Singapore.||Abstract:||Hardware Intrinsic Security (HIS) is currently a very crucial aspect of the electronics industry aimed towards protecting hardware IPs from infringement. Also, Wireless Sensor Nodes (WSNs) that are increasingly acting as a backbone to the information channels need a secure and low-power encryption system to protect them from malicious attacks. Traditional electronic devices store encrypted keys in battery-powered volatile memories or use Non-Volatile Memories for permanent storage of security keys. These are not very secure since the security key is exposed and relatively easy to hack from Non-Volatile Memory (NVM). Additionally, it comparatively consumes more power for operating over a long period of time. Thus, SRAM-PUF can provide a viable solution to both the problems - secure encryption & minimal power consumption.||URI:||https://hdl.handle.net/10356/55937||DOI:||10.32657/10356/55937||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Theses|
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