Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/5813
Title: Large surface profile measurement with instantaneous phase shifting interferometry
Authors: Hui, Wei Kee.
Keywords: DRNTU::Engineering::Manufacturing::Metrology
Issue Date: 2003
Abstract: In this research, an optical layout that uses the concept of array of points with a modified Michelson interferometer has been proposed. With this setup, a relatively large surface area can be measured without the need for time consuming scanning. In combination with instantaneous phase shifting arrangement, the system is therefore immune to vibration.
URI: http://hdl.handle.net/10356/5813
Schools: School of Mechanical and Production Engineering 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Theses

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