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https://hdl.handle.net/10356/5813
Title: | Large surface profile measurement with instantaneous phase shifting interferometry | Authors: | Hui, Wei Kee. | Keywords: | DRNTU::Engineering::Manufacturing::Metrology | Issue Date: | 2003 | Abstract: | In this research, an optical layout that uses the concept of array of points with a modified Michelson interferometer has been proposed. With this setup, a relatively large surface area can be measured without the need for time consuming scanning. In combination with instantaneous phase shifting arrangement, the system is therefore immune to vibration. | URI: | http://hdl.handle.net/10356/5813 | Schools: | School of Mechanical and Production Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | MAE Theses |
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MAE-THESES_325.pdf Restricted Access | 4.51 MB | Adobe PDF | View/Open |
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