Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/5939
Title: To compare and evaluate various non destructive testing (NDT) methods on microelectronics - flexible microcircuit
Authors: Lee, Gee Kean.
Keywords: DRNTU::Engineering::Mechanical engineering::Mechatronics
Issue Date: 2001
Abstract: This reports covers the basic concepts and methodologies of some non destructive testing (NDT) on a very thin layer of flexible micro-circuit, of polyimide base, used in electronic industry.
URI: http://hdl.handle.net/10356/5939
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Theses

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