Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/5998
Title: Development of sharp and high aspect ratio atomic force microscope probe tip
Authors: Lim, Boon Hong.
Keywords: DRNTU::Engineering::Manufacturing::Metrology
Issue Date: 2001
Abstract: This project designed AFM probe tips to minimise errors, along with methods of micromachining them.
URI: http://hdl.handle.net/10356/5998
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Theses

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