Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/60612
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dc.contributor.authorDai, Qi
dc.date.accessioned2014-05-29T02:38:54Z
dc.date.available2014-05-29T02:38:54Z
dc.date.copyright2010en_US
dc.date.issued2010
dc.identifier.urihttp://hdl.handle.net/10356/60612
dc.description.abstractThis thesis addresses the defect reduction and control in a printing process at a food packaging company now experiencing hundreds of printing defects. Methodologies of Define, Measure, Analyze, Improve, and Control (DMAIC), and Response Surface Model were introduced to reduce the defect rate and control the process. As a result, critical inputs were identified, and a set of statistical regression models were constructed to predict the flaw size and its variance by knowing the critical inputs of the process. The mathematical optimal settings were determined to minimize the flaw size and its variance. Moreover, advanced control charts, and detailed Out-of-Control-Action-Plans (OCAP) were developed to monitor and control the process.en_US
dc.format.extent58 p.en_US
dc.language.isoenen_US
dc.subjectDRNTU::Engineering::Manufacturingen_US
dc.titleDefect reduction and control based on application of process controlen_US
dc.typeThesis
dc.contributor.supervisorYue Chee Yoonen_US
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen_US
dc.description.degree​Master of Science (IMST)en_US
dc.contributor.researchSingapore-MIT Alliance Programmeen_US
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