Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/60617
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dc.contributor.authorAshish Maskara
dc.contributor.authorTajan, John Benedict
dc.contributor.authorWang, Lisha
dc.date.accessioned2014-05-29T02:46:15Z
dc.date.available2014-05-29T02:46:15Z
dc.date.copyright2004en_US
dc.date.issued2004
dc.identifier.urihttp://hdl.handle.net/10356/60617
dc.description.abstractThe highly competitive nature of the ink jet supplies business has resulted in shorter product life cycles and lower profit margins amidst greater customer expectations. The early identification and resolution of sources of yield loss, especially during the product ramp-up stage, is vital to the continued profitability of the HP wafer fabrication facility in Singapore. Conventional yield analysis methods currently being employed have been deemed inadequate in accelerating the identification of potential sources of yield loss. Unconventional yield analysis methodologies which are accurate and easy to use are required to uncover unknown sources of yield loss.en_US
dc.format.extent109 p.en_US
dc.language.isoenen_US
dc.subjectDRNTU::Engineering::Manufacturingen_US
dc.titleRobust algorithms for identifying sources of yield impact in a reentrant manufacturing systemen_US
dc.typeThesis
dc.contributor.supervisorYoon Soon Fatten_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degree​Master of Science (IMST)en_US
dc.contributor.organizationHewlett-Packard (HP)en_US
dc.contributor.researchSingapore-MIT Alliance Programmeen_US
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