Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/60715
Title: Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production
Authors: N. B. Vignesh
Zhong, Yi
Che, Yi
Keywords: DRNTU::Engineering::Manufacturing
Issue Date: 2004
Abstract: This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor interconnects. A reliable evaluation and measurement technique is developed, based on online monitoring of electrical parameters with high measuring resolution. Local monitoring of temperature and humidity with increased sampling rate provides a higher resolution and is far more effective in understanding the degradation mechanisms of semiconductor interconnects. Thus the new system provides a good predictive capability of the Mean Time to Failure (MTF) of adhesive interconnects. Also the present system isn't friendly enough for data handling and interpretation. Hence separate programs called - 'Real World & Deeper Analysis' have been developed for easy data handling and analysis.
URI: http://hdl.handle.net/10356/60715
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:SMA Theses

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