Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/6083
Title: Process and reliability studies of solder bumping using eutectic sn/pb solder
Authors: Lo, Marvin Chen Yang.
Keywords: DRNTU::Engineering::Manufacturing::Production management
Issue Date: 2005
Abstract: This project studies the differences in solder bumping using different bumping technologies. The two technologies of interest are printing technology and plating technology for solder deposition process. It was found that printing technology required two mask sets as compared to 1 mask for plating technology. In printing technology, bump voids are an inherent defect and must be controlled to within less than 30% of the bump volume. The additional mask cost will add to the production cost. In large volume manufacturing, the price for bumping between printing and plating is now close to each other.
URI: http://hdl.handle.net/10356/6083
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Theses

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