Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/61093
Title: Panoramic image stitching
Authors: Wong, Joniece Jing Yi
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation
Issue Date: 2014
Abstract: Panoramic images were first created in the middle of the 19th century and it became popular in modern days. It has progressed greatly through the use of computer image processing methods to create panoramas digitally. The word ‘panorama’ comes from the Greek words pân and hòrama, which meant ‘to see everything’. [2] An image stitching program is developed by the student to stitch images with an overlapped region. In this final year project, the Scale Invariant Feature Transform (SIFT) algorithm is used to detect interest points and compute their descriptors. These descriptors are used for matching interest points between images, and the images are combined using the information provided by the SIFT descriptors. This report also includes a brief introduction on two other popular interest point detectors, such as the Harris Corner Detector, the Local Binary Detector (LBP), and will focus mainly on the Scale Invariant Feature Transform (SIFT).
URI: http://hdl.handle.net/10356/61093
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

Files in This Item:
File Description SizeFormat 
FYP FINAL Report_Joniece Wong.pdf
  Restricted Access
Final Year Report2.9 MBAdobe PDFView/Open

Page view(s) 50

221
checked on Oct 28, 2020

Download(s) 50

6
checked on Oct 28, 2020

Google ScholarTM

Check

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.