Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/61425
Title: Reliability study of high brightness leds under high frequency switching current and thermal cycling condition
Authors: Wang, Kai
Keywords: DRNTU::Engineering
Issue Date: 2014
Abstract: With the development in Visible Light Communication (VLC), and LED is a key component in that system, study the reliability of LED under power cycling and thermal cycling becomes a popular project around the world. In this project, by understanding and summarizing lots of previous researches in LED reliability, a re-designed circuit is used for testing the optical output of LED under power and thermal cycling. After comparing the data with previous studies, switching frequency seems to be an important coefficient in LED degradation, especially the chip, and lots of data shows thermal cycling can accelerate the degradation of whole package.
URI: http://hdl.handle.net/10356/61425
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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