Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/6226
Title: Development and application of a moire interferometric strain sensor
Authors: Oh, Kim Eng
Keywords: DRNTU::Engineering::Manufacturing::Metrology
Issue Date: 2000
Abstract: Moire Interferometry is a whole field, high sensitive technique for deformation measurement. It is a good experimental technique that has a combination of high sensitivity, optical contrast, range and spatial resolution. This experimental technique relies on interference of high frequency deformable specimen grating with a fixed reference grating to obtain contours of in-plane displacement components with sub-micron sensitivity. In this project, a moire interferometric strain sensor is designed and developed to improve the shortcomings and limitations of the commercial available moire interferometer, which is unable to resolve very small and localized vicinity.
URI: http://hdl.handle.net/10356/6226
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Theses

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