Comparative studies on the effectiveness between X and synthetic control charts

Abstract

Traditional X Charts used for Statistical process control is quite ineffective in detecting small shifts in mean. In this project, a Synthetic chart has been designed and a comparative study on the effectiveness between X and Synthetic Control Charts is conducted. This is accomplished by analyzing the detective power of both the control charts on different mean shifts. A desired process is chosen for this study and real data from the shop floor are used. The results of tests show that the Synthetic charts is more significantly effective in detecting mean shifts compared to the X chart. Further to that, an on-line Statistical process control is designed using the Synthetic chart, integrated with a Shop floor control system. Thus, the Synthetic chart is being implemented in a Computer Integrated Manufacturing (CIM) environment.