Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/63816
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ang, Derrick Jia Hao | |
dc.date.accessioned | 2015-05-19T05:22:19Z | |
dc.date.available | 2015-05-19T05:22:19Z | |
dc.date.copyright | 2015 | en_US |
dc.date.issued | 2015 | |
dc.identifier.uri | http://hdl.handle.net/10356/63816 | |
dc.description.abstract | This report introduce the research status of thermoelectric cooling on semiconductors such as diode and semiconductor wafer. Measurement of current-voltage characteristic of semiconductor diodes by applying thermoelectric cooling device to determine how temperature affects its quality and operation. In addition, experiments are conducted on epitaxial silicon-germanium wafers on hot plate and by applying thermoelectric cooling device to determine the effect of thermal dissipation using Fourier’s law to show the effect of thermoelectric cooling. Measurement results and findings of the experiments will be discussed in detail in this report. | en_US |
dc.format.extent | 65 p. | en_US |
dc.language.iso | en | en_US |
dc.rights | Nanyang Technological University | |
dc.subject | DRNTU::Engineering::Electrical and electronic engineering | en_US |
dc.title | Reduced temperature electrical measurement of semiconductor devices | en_US |
dc.type | Final Year Project (FYP) | en_US |
dc.contributor.supervisor | Wong Kin Shun, Terence | en_US |
dc.contributor.school | School of Electrical and Electronic Engineering | en_US |
dc.description.degree | Bachelor of Engineering | en_US |
item.fulltext | With Fulltext | - |
item.grantfulltext | restricted | - |
Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
ANGJIAHAODERRICK_FYPREPORT.pdf Restricted Access | Main article | 4.03 MB | Adobe PDF | View/Open |
Page view(s)
292
Updated on Nov 12, 2024
Download(s)
10
Updated on Nov 12, 2024
Google ScholarTM
Check
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.