Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/6408
Title: Development of a 3D optical testing system for the study of IC packaging
Authors: Su, Fei.
Keywords: DRNTU::Engineering::Manufacturing
Issue Date: 2004
Abstract: The main objective of this study is to develop an advanced 3-D optical testing system to measure the deformations of IC packages accurately and comprehensively. The present study consists of two parts: 1) development and construction of an advanced compact 3-D optical testing system; and 2) application of the 3-D optical testing system to IC packages for their hygro-thermo-mechanical reliability evaluation.
URI: http://hdl.handle.net/10356/6408
Schools: School of Mechanical and Production Engineering 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Theses

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