Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/64176
Title: New product test development
Authors: Chew, Teow Kim
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2015
Abstract: Silicon Labs is a leading provider of silicon, software and system solutions for the Internet of Things, Internet infrastructure, industrial control, consumer and automotive markets. Its portfolio of mixed-signal integrated circuits (ICs) includes microcontrollers (MCUs), sensors, wireless ICs, timing devices, digital isolators and broadcast audio and video products. Due to unavoidable statistical flaws in the materials and masks used to fabricate ICs, there is no doubt that 100% yield on any particular IC is impossible. It is in the chip manufacturer’s best interest to minimize the number of bad devices shipped to the customer, thus the need for IC testing for quality assurance. This project will focus on studying of the GT7 test development manual, the C8051Fxxx small MCU devices and convert the existing 8 bit GT6 Platform testing software to the upgraded 32 bit GT7S Platform testing software, to test on its analog peripherals. Small form factor microcontrollers are MCUs available in tiny packages (down to 2 x 2 mm) with no compromise in performance or integration. The C8051Fxxx small MCU devices are available in 24-pin, 28pin and 32-pin packages and include 16 kB flash with 10-bit ADC. At the end of the project, a golden ratio correlation test will be conducted between the MCUs tested on the GT7S testing platform and on the GT6 testing platform. This test ensures that data obtained from the new testing platform can repeat values obtained from the old testing platform, thus proving its reliability.
URI: http://hdl.handle.net/10356/64176
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

Files in This Item:
File Description SizeFormat 
FYP Final Report.pdf
  Restricted Access
1.08 MBAdobe PDFView/Open

Google ScholarTM

Check

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.