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Title: Electrical and optical characterisation of novel semiconductor lasers
Authors: Shang, Yushan
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2015
Abstract: This report summarize on the entire nine months of Final Year Project research on characteristics and experimental works for laser devices, namely the semiconductor laser samples and its processing and development. This also includes the characterization tests such as the electrical property test, optical property test and descriptions of a Quantum Cascade Laser (QCL) device with its performance improvements in greater details. The research part of the report includes the modern technology development of laser, various types of modern lasers available today, how semi-conductor laser functions and what are the Quantum Cascade Laser (QCL) device operational principles and its applications. Experimental part of the report emphasis on the fabrication process such as photo-lithography, dry etching, PECVD and grinding/polishing. It shows how the semi-conductor laser sample is implemented in the Nano-fabrication Centre before the characterization tests can be performed. Various researches on grinding and back polishing are done prior to going through practices and experiments. The polishing of the wafer sample allows it to have better optimizations in its electrical and optical characterization tests. Throughout these nine months of learning both at NTU Nano-fabrication Canter and Characterization Laboratory, I have gained greater insights in the Clean Room working environment processes and obtained a more in-depth learning on how to accomplish semi-conductor processes step by step. Lastly, the characterization tests and procedures are discussed in the next section. Explanation of the results obtained through the characterization tests is also elaborated. Recommendation of the future grinding and characterization testing are also available at the final component of the report. I believe I have a meaningful learning experience throughout these nine months.
Schools: School of Electrical and Electronic Engineering 
Research Centres: Facility for Analysis, Characterisation, Testing and Simulation 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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