Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/65808
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dc.contributor.authorLim, Kai Yi
dc.date.accessioned2015-12-15T03:34:12Z
dc.date.available2015-12-15T03:34:12Z
dc.date.copyright2015en_US
dc.date.issued2015
dc.identifier.urihttp://hdl.handle.net/10356/65808
dc.description.abstractThe purpose of this report is to details the function and reliability test done to the Automated Wafer Management System. The results of these tests will determine the system reliability and whether given functionality works as specified. The anticipated outcome of these tests is to identify the problems in the system design and functionality. The findings can be used to improve the performance and eliminated failure mode of the system. Through these tests, we have found out the limitations of the equipment and the reliability of the system. These tests have aid in reaching the next milestone of the project.en_US
dc.format.extent59 p.en_US
dc.language.isoenen_US
dc.rightsNanyang Technological University
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Semiconductorsen_US
dc.titleAutomated wafer management systemen_US
dc.typeFinal Year Project (FYP)en_US
dc.contributor.supervisorK Radhakrishnanen_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeBachelor of Engineeringen_US
item.grantfulltextrestricted-
item.fulltextWith Fulltext-
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)
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