Please use this identifier to cite or link to this item:
Title: Automated wafer management system
Authors: Lim, Kai Yi
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
Issue Date: 2015
Abstract: The purpose of this report is to details the function and reliability test done to the Automated Wafer Management System. The results of these tests will determine the system reliability and whether given functionality works as specified. The anticipated outcome of these tests is to identify the problems in the system design and functionality. The findings can be used to improve the performance and eliminated failure mode of the system. Through these tests, we have found out the limitations of the equipment and the reliability of the system. These tests have aid in reaching the next milestone of the project.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

Files in This Item:
File Description SizeFormat 
final year report.pdf
  Restricted Access
1.78 MBAdobe PDFView/Open

Page view(s)

Updated on Aug 7, 2022


Updated on Aug 7, 2022

Google ScholarTM


Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.