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https://hdl.handle.net/10356/65808| Title: | Automated wafer management system | Authors: | Lim, Kai Yi | Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Semiconductors | Issue Date: | 2015 | Abstract: | The purpose of this report is to details the function and reliability test done to the Automated Wafer Management System. The results of these tests will determine the system reliability and whether given functionality works as specified. The anticipated outcome of these tests is to identify the problems in the system design and functionality. The findings can be used to improve the performance and eliminated failure mode of the system. Through these tests, we have found out the limitations of the equipment and the reliability of the system. These tests have aid in reaching the next milestone of the project. | URI: | http://hdl.handle.net/10356/65808 | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| final year report.pdf Restricted Access | 1.78 MB | Adobe PDF | View/Open |
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