Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/66005
Title: An enhanced X-ray imaging contrast using a grating-based talbot interferometry
Authors: Liew, Seaw Jia
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2016
Source: Liew, S. J. (2016). An enhanced X-ray imaging contrast using a grating-based talbot interferometry. Master's thesis, Nanyang Technological University, Singapore.
Abstract: We often deal with objects made of low-density materials in various settings, such as soft biological tissues in the medical sciences and manufacturing of food, and low-density polymeric substances in the manufacturing of medical devices and automotive parts. Inspection of low-density materials using the conventional X-ray imaging that is based on the principle of X-ray absorptions often results in a lack of image contrast because these materials do not generate satisfactory absorptioncontrast under the irradiation of typical range of hard X-rays. Furthermore, in many cases, the objects always come in irregular form of shapes and sizes, this makes the X-ray imaging challenging as different X-ray energies are required to penetrate through different range of object thickness in order to provide a satisfactory visibility of fine defects and structural profiles residing beneath the surface.
URI: http://hdl.handle.net/10356/66005
metadata.item.grantfulltext: restricted
metadata.item.fulltext: With Fulltext
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