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|Title:||An enhanced X-ray imaging contrast using a grating-based talbot interferometry||Authors:||Liew, Seaw Jia||Keywords:||DRNTU::Engineering::Electrical and electronic engineering||Issue Date:||2016||Source:||Liew, S. J. (2016). An enhanced X-ray imaging contrast using a grating-based talbot interferometry. Master's thesis, Nanyang Technological University, Singapore.||Abstract:||We often deal with objects made of low-density materials in various settings, such as soft biological tissues in the medical sciences and manufacturing of food, and low-density polymeric substances in the manufacturing of medical devices and automotive parts. Inspection of low-density materials using the conventional X-ray imaging that is based on the principle of X-ray absorptions often results in a lack of image contrast because these materials do not generate satisfactory absorptioncontrast under the irradiation of typical range of hard X-rays. Furthermore, in many cases, the objects always come in irregular form of shapes and sizes, this makes the X-ray imaging challenging as different X-ray energies are required to penetrate through different range of object thickness in order to provide a satisfactory visibility of fine defects and structural profiles residing beneath the surface.||URI:||https://hdl.handle.net/10356/66005||DOI:||10.32657/10356/66005||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Theses|
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|MEng thesis-LiewSeawJia-Hardbound %2816 feb 2016%29 (1) (1).pdf||2.07 MB||Adobe PDF|
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