Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/66005
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dc.contributor.authorLiew, Seaw Jiaen
dc.date.accessioned2016-02-24T13:37:02Zen
dc.date.available2016-02-24T13:37:02Zen
dc.date.issued2016en
dc.identifier.citationLiew, S. J. (2016). An enhanced X-ray imaging contrast using a grating-based talbot interferometry. Master's thesis, Nanyang Technological University, Singapore.en
dc.identifier.urihttps://hdl.handle.net/10356/66005en
dc.description.abstractWe often deal with objects made of low-density materials in various settings, such as soft biological tissues in the medical sciences and manufacturing of food, and low-density polymeric substances in the manufacturing of medical devices and automotive parts. Inspection of low-density materials using the conventional X-ray imaging that is based on the principle of X-ray absorptions often results in a lack of image contrast because these materials do not generate satisfactory absorptioncontrast under the irradiation of typical range of hard X-rays. Furthermore, in many cases, the objects always come in irregular form of shapes and sizes, this makes the X-ray imaging challenging as different X-ray energies are required to penetrate through different range of object thickness in order to provide a satisfactory visibility of fine defects and structural profiles residing beneath the surface.en
dc.format.extent102 p.en
dc.language.isoenen
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen
dc.titleAn enhanced X-ray imaging contrast using a grating-based talbot interferometryen
dc.typeThesisen
dc.contributor.supervisorSoh Yeng Chaien
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.description.degreeMASTER OF ENGINEERING (EEE)en
dc.contributor.organizationA*STAR Singapore Institute of Manufacturing Technologyen
dc.contributor.organizationSPRING Singaporeen
dc.contributor.organizationJM Vistec Systems Pte Ltden
dc.identifier.doi10.32657/10356/66005en
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