Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/68680
Title: Applications of gratings
Authors: Li, Xinyi
Keywords: DRNTU::Engineering::Mechanical engineering
Issue Date: 2016
Abstract: Gratings are fundamental and important elements in optical metrology. Our particular interest involves two applications of gratings which are optical spectrometer and three-dimensional (3D) profilometer. An one-layer thin film thickness measurement system is established based on spectrometer, in which the deflection is produced by diffraction in a diffraction grating. A calculation method derived from thin film interference principle is applied to postprocessing. As the second important application of grating, 3D profilometer combines the grating theory with illumination technique, and is used for surface measurement. In other part of this project, a 3D profilometer is designed using Digital Light Processing (DLP) fringe projector and CCD camera. Moreover, a few attempts to measure the different types of specimens have already been made with this 3D profilometer to identify what effects would be induced by diffusive and shiny surface, dark and bright environment, black and white color of objects, and polarizer.
URI: http://hdl.handle.net/10356/68680
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Theses

Files in This Item:
File Description SizeFormat 
Li_Xinyi_2015.pdf
  Restricted Access
Main report21.7 MBAdobe PDFView/Open

Page view(s) 10

94
checked on Sep 28, 2020

Download(s) 10

10
checked on Sep 28, 2020

Google ScholarTM

Check

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.