Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/6884
Title: Direct observation of frictional seizure and wear by X-Ray imaging
Authors: Batchelor, Andrew William
Loh, Nee Lam
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
Issue Date: 1998
Abstract: The objective of this project is to conduct in-situ wear studies in an x-ray microscopy, which facilitates observation of the centre of contact during tribological testing.
URI: http://hdl.handle.net/10356/6884
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:MAE Research Reports (Staff & Graduate Students)

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