Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/6884
Title: | Direct observation of frictional seizure and wear by X-Ray imaging | Authors: | Batchelor, Andrew William Loh, Nee Lam |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing | Issue Date: | 1998 | Abstract: | The objective of this project is to conduct in-situ wear studies in an x-ray microscopy, which facilitates observation of the centre of contact during tribological testing. | URI: | http://hdl.handle.net/10356/6884 | Schools: | School of Mechanical and Production Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | MAE Research Reports (Staff & Graduate Students) |
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File | Description | Size | Format | |
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MPE-RESEARCH-REPORT_174.pdf Restricted Access | 4.33 MB | Adobe PDF | View/Open |
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