Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/73102
Title: Characterisation of an electronic speckle pattern interferometry with active wavefronts
Authors: Joshi, Amita
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2018
Abstract: Electronic-Speckle-Pattern-Interferometry (ESPI) is a versatile technique for shape measurements of rough surfaces. The ESPI is limited by two effects: the diffraction on sharp edges and the 2π-modulo-periodicity based on the interferometric principle. Thus, this method is restricted to smooth surfaces with small height variations respective the used synthetic wavelength. To extend the measurement range to complex surface structures, the reference wavefront of the ESPI-setup will be adapted to the measurement object by a liquid crystal modulator. In this study, an automated process for the measurement of surface shapes with active wavefronts shall be developed. This includes the controlling of the system parameters, the image recording and the data processing. Based on these findings, the system will be tested and characterized.
URI: http://hdl.handle.net/10356/73102
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Theses

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