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https://hdl.handle.net/10356/73941
Title: | FYP examiner allocation system improvement part 2 | Authors: | Chee, Karen | Keywords: | DRNTU::Engineering::Computer science and engineering | Issue Date: | 2018 | Abstract: | At Nanyang Technological University, it is mandatory that all students from the School of Computer Science and Engineering (SCSE) take the Final Year Project (FYP) as part of the curriculum requirements for the Degree of Bachelor of Computer Science. The FYP spans over two semesters and must be examined and accessed by staffs for examination purposes. The allocation of examiners to grade each student’s FYP is performed using the FYP Examiner Allocation (FEA) system. The current FYP Examiner system was first built in 2007 and is approximately eleven years old. Due to the many limitations in the system and outdated features, it has been deemed unfit for usage in the future. As such, an improved FEA system was implemented. The improved FEA system is the current FEA system with improved features. Even so, there still exist issues and limitations that have yet to be resolved. Therefore, the aim of this project ‘FYP Examiner Allocation System Improvement Part 2 - SCE17-0220’, is to develop and improve a new FEA system with upgraded components and new features to overcome the limitations of the current FEA system. The new system will be more user-friendly, flexible and highly modular to allow changes to be made easily. | URI: | http://hdl.handle.net/10356/73941 | Schools: | School of Computer Science and Engineering | Rights: | Nanyang Technological University | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | SCSE Student Reports (FYP/IA/PA/PI) |
Files in This Item:
File | Description | Size | Format | |
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KAREN CHEE (SCE17-0220) - Amended Report .pdf Restricted Access | Final Year Report (Amended Version) | 1.87 MB | Adobe PDF | View/Open |
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