Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/76088
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dc.contributor.authorYu, Cunyang
dc.date.accessioned2018-10-24T04:28:14Z
dc.date.available2018-10-24T04:28:14Z
dc.date.issued2018
dc.identifier.urihttp://hdl.handle.net/10356/76088
dc.description.abstractSemiconductor alloys have been widely used in engineering and the different material properties can be obtained by changing the composition of the alloy. Ge and Si are extensively used in electronic devices. However, the indirect nature of the band gap of group IV materials is the mainly limitation for the application in the optoelectronics. Ge1-xSnx is a promising alloy to tune the nature of indirect band gap to direct bandgap by tuning the composition of Sn. This project is to investigate the electronic band structure of Ge1-xSnx in different composition of Sn and the influence of the change of other parameters such as temperature and tensile. The k.p method will be used to calculate the band edge dispersion at Γ-point.en_US
dc.format.extent75 p.en_US
dc.language.isoenen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen_US
dc.titleElectronic band structure of Ge1-xSnx alloysen_US
dc.typeThesis
dc.contributor.supervisorZhang Dao Huaen_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeMaster of Science (Green Electronics)en_US
dc.contributor.organizationTechnical University of Munichen_US
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