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Title: Deposition and characterization of Bismuth nanofilm by sputtering
Authors: Seah, Jeric Tze Jie
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2019
Abstract: Bismuthene, a layer of bismuth atoms, is predicted to be layered semiconductor, while its bulk counterpart is metallic. In this project, fabrication of bismuth thin films under different conditions will be done using the new sputtering system in NTU Nanoelectronics Lab 1 (NEL1) and characterization of the nanofilms will also be done using techniques such as Raman spectroscopy and Energy-dispersive X-ray spectroscopy. Atomic force microscopy will also be utilized to measure the thickness of the nanofilms and to ascertain the topology of the sample surface.
Schools: School of Electrical and Electronic Engineering 
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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