Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/79246
Title: A new unified model for channel thermal noise of deep sub-micron RFCMOS
Authors: Ong, Shih Ni
Yeo, Kiat Seng
Chan, Lye Hock
Loo, Xi Sung
Boon, Chirn Chye
Do, Manh Anh
Chew, Kok Wai Johnny
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2009
Source: Ong, S. N., Yeo, K. S., Chan, L. H., Loo, X. S., Boon, C. C., Do, M. A., et al. (2009). A new unified model for channel thermal noise of deep sub-micron RFCMOS. IEEE International Symposium on Radio-Frequency Integration Technology, Singapore, 280-283.
Conference: IEEE International Symposium on Radio-Frequency Integration Technology (2009 : Singapore)
Abstract: A new unified model for circuit simulation is presented to predict the high frequency channel thermal noise of deep sub-micron MOSFETs in strong inversion region. Based on the new channel thermal noise model, the simulated channel thermal noise spectral densities of the devices fabricated in a 0.13μm RFCMOS technology process are compared to the channel noise directly extracted from RF noise measurements.
URI: https://hdl.handle.net/10356/79246
http://hdl.handle.net/10220/6349
DOI: 10.1109/RFIT.2009.5383701
Schools: School of Electrical and Electronic Engineering 
Organisations: Chartered Semiconductor Manufacturing Ltd
Rights: © 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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