Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/79256
Title: A robust recognition error recovery for micro-flow cytometer by machine-learning enhanced single-frame super-resolution processing
Authors: Huang, Xiwei
Wang, Xiaolong
Yan, Mei
Yu, Hao
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
Issue Date: 2014
Source: Huang, X., Wang, Xi., Yan, M., & Yu, H. (2014). A robust recognition error recovery for micro-flow cytometer by machine-learning enhanced single-frame super-resolution processing. Integration, the VLSI journal, 51, 208-218.
Series/Report no.: Integration, the VLSI journal
Abstract: With the recent advancement in microfluidics based lab-on-a-chip technology, lensless imaging system integrating microfluidic channel with CMOS image sensor has become a promising solution for the system minimization of flow cytometer. The design challenge for such an imaging-based micro-flow cytometer under poor resolution is how to recover cell recognition error under various flow rates. A microfluidic lensless imaging system is developed in this paper using extreme-learning-machine enhanced single-frame super-resolution processing, which can effectively recover the recognition error when increasing flow rate for throughput. As shown in the experiments, with mixed flowing HepG2 and Huh7 cells as inputs, the developed scheme shows that 23% better recognition accuracy can be achieved compared to the one without error recovery. Meanwhile, it also achieves an average of 98.5% resource saving compared to the previous multi-frame super-resolution processing.
URI: https://hdl.handle.net/10356/79256
http://hdl.handle.net/10220/24495
ISSN: 0167-9260
DOI: 10.1016/j.vlsi.2014.07.004
Schools: School of Electrical and Electronic Engineering 
Rights: © 2014 Elsevier B.V. This is the author created version of a work that has been peer reviewed and accepted for publication by Integration, the VLSI Journal, Elsevier B.V. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1016/j.vlsi.2014.07.004].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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