Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/79274
Title: Degradation model of a linear-mode LED driver and its application in lifetime prediction
Authors: Lan, Song
Tan, Cher Ming
Issue Date: 2014
Source: Lan, S., & Tan, C. M. (2014). Degradation model of a linear-mode LED driver & its application in lifetime prediction. IEEE Transactions on Device and Materials Reliability, 14(3), 904-913.
Series/Report no.: IEEE Transactions on Device and Materials Reliability
Abstract: The degradations of a linear-mode LED driver under different voltage stresses are studied. This driver provides a constant current when the output voltage is biased greater than a knee-point voltage. During the stress tests, the knee-point voltage is found to increase due to the aging of the output transistor in the driver. As the knee-point voltage exceeds the applied output voltage, the output current cannot be maintained as constant, and the driver is considered failure. Therefore, the lifetime of the driver can be estimated from the knee-point voltage degradation. In this paper, a lifetime extrapolation method is proposed based on an internal circuit degradation mechanism. The correlations between the degradation model parameters and the applied stress are deduced, and the lifetime of the driver under different voltage stresses can be predicted with this correlation.
URI: https://hdl.handle.net/10356/79274
http://hdl.handle.net/10220/38725
ISSN: 1530-4388
DOI: 10.1109/TDMR.2014.2343253
Rights: © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/TDMR.2014.2343253].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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