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Title: Blurred image splicing localization by exposing blur type inconsistency
Authors: Bahrami, Khosro
Kot, Alex Chichung
Li, Leida
Li, Haoliang
Keywords: DRNTU::Engineering::Computer science and engineering::Computing methodologies::Image processing and computer vision
Issue Date: 2015
Source: Bahrami, K., Kot, A. C., Li, L.,& Li, H. (2015). Blurred Image Splicing Localization by Exposing Blur Type Inconsistency. IEEE Transactions on Information Forensics and Security, 10(5), 999-1009.
Series/Report no.: IEEE transactions on information forensics and security
Abstract: In a tampered blurred image generated by splicing, the spliced region and the original image may have different blur types. Splicing localization in this image is a challenging problem when a forger uses some postprocessing operations as antiforensics to remove the splicing traces anomalies by resizing the tampered image or blurring the spliced region boundary. Such operations remove the artifacts that make detection of splicing difficult. In this paper, we overcome this problem by proposing a novel framework for blurred image splicing localization based on the partial blur type inconsistency. In this framework, after the block-based image partitioning, a local blur type detection feature is extracted from the estimated local blur kernels. The image blocks are classified into out-of-focus or motion blur based on this feature to generate invariant blur type regions. Finally, a fine splicing localization is applied to increase the precision of regions boundary. We can use the blur type differences of the regions to trace the inconsistency for the splicing localization. Our experimental results show the efficiency of the proposed method in the detection and the classification of the out-of-focus and motion blur types. For splicing localization, the result demonstrates that our method works well in detecting the inconsistency in the partial blur types of the tampered images. However, our method can be applied to blurred images only. .
ISSN: 1556-6013
DOI: 10.1109/TIFS.2015.2394231
Schools: School of Electrical and Electronic Engineering 
Rights: © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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