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Title: An innovative method for coordinate measuring machine one-dimensional self-calibration with simplified experimental process
Authors: Fang, Cheng
Butler, David Lee
Issue Date: 2013
Source: Fang, C.,& Butler, D. L. (2013). An innovative method for coordinate measuring machine one-dimensional self-calibration with simplified experimental process. Review of Scientific Instruments, 84(5).
Series/Report no.: Review of scientific instruments
Abstract: In this paper, an innovative method for CMM (Coordinate Measuring Machine) self-calibration is proposed. In contrast to conventional CMM calibration that relies heavily on a high precision reference standard such as a laser interferometer, the proposed calibration method is based on a low-cost artefact which is fabricated with commercially available precision ball bearings. By optimizing the mathematical model and rearranging the data sampling positions, the experimental process and data analysis can be simplified. In mathematical expression, the samples can be minimized by eliminating the redundant equations among those configured by the experimental data array. The section lengths of the artefact are measured at arranged positions, with which an equation set can be configured to determine the measurement errors at the corresponding positions. With the proposed method, the equation set is short of one equation, which can be supplemented by either measuring the total length of the artefact with a higher-precision CMM or calibrating the single point error at the extreme position with a laser interferometer. In this paper, the latter is selected. With spline interpolation, the error compensation curve can be determined. To verify the proposed method, a simple calibration system was set up on a commercial CMM. Experimental results showed that with the error compensation curve uncertainty of the measurement can be reduced to 50%.
ISSN: 0034-6748
DOI: 10.1063/1.4801953
Schools: School of Mechanical and Aerospace Engineering 
Rights: © 2013 AIP Publishing LLC. This paper was published in Review of Scientific Instruments and is made available as an electronic reprint (preprint) with permission of AIP Publishing LLC. The paper can be found at the following official DOI: [].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
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