Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/79853
Title: Polarization dependence of intraband absorption in self-organized quantum dots
Authors: Chua, S. J.
Xu, S. J.
Zhang, X. H.
Wang, X. C.
Mei, T.
Fan, Weijun
Wang, C. H.
Jiang, J.
Xie, X. G.
Keywords: Electrical and Electronic Engineering
Issue Date: 1998
Source: Chua, S. J., Xu, S. J., Zhang, X. H., Wang, X. C., Mei, T., Fan, W., Wang, C. H., Jiang, J., & Xie, X. G. (1998). Polarization dependence of intraband absorption in self-organized quantum dots. Applied Physics Letters, 73(14), 1997.
Series/Report no.: Applied physics letters
Abstract: Photoluminescence and intraband absorption were investigated in n-doped self-organized InAs and In0.35Ga0.65As quantum dots grown on a GaAs substrate. Intraband absorption of the dots is strongly polarized along the growth axis in the mid infrared spectral range. The absorption is maximum at around 120 meV for InAs dots and at 130 meV for In0.35Ga0.65As dots. The experimental results on InAs dots are in agreement with published theoretical calculations.
URI: https://hdl.handle.net/10356/79853
http://hdl.handle.net/10220/17881
ISSN: 0003-6951
DOI: 10.1063/1.122347
Schools: School of Electrical and Electronic Engineering 
Organisations: Institute of Materials Research and Engineering, National University of Singapore
Rights: © 1998 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.122347].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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