Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/79905
Title: Micromachined switchable metamaterial with dual resonance
Authors: Liu, A. Q.
Zhu, W. M.
Li, E. P.
Tanoto, H.
Wu, Q. Y.
Zhang, W.
Zhang, X. H.
Tsai, M. L. J.
Teng, Jing Hua
Lo, Guo-Qing
Kwong, Dim Lee
Keywords: DRNTU::Engineering::Materials::Metallic materials
Issue Date: 2012
Source: Zhang, W., Liu, A. Q., Zhu, W. M., Li, E. P., Tanoto, H., Wu, Q. Y., et al. (2012). Micromachined switchable metamaterial with dual resonance. Applied physics letters, 101(15), 151902-.
Series/Report no.: Applied physics letters
Abstract: We experimentally demonstrate a micromachined switchable metamaterial with dual mode resonance which is induced at THz regime under oblique incidence. Here, we explore, both theoretically and experimentally, the dynamic dual mode switching by reshaping metamaterial elements using micromachined actuators. The mode switching allows robust control over the transmission and the reflection of the metamaterial at 0.76 THz and 1.16 THz. Such switchable dual mode metamaterial promises wide applications in optical switches, tunable filters, and THz detectors.
URI: https://hdl.handle.net/10356/79905
http://hdl.handle.net/10220/9127
ISSN: 0003-6951
DOI: 10.1063/1.4759029
Schools: School of Electrical and Electronic Engineering 
Rights: © 2012 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.4759029]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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