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|Title:||Characteristics of defect modes in side-coupled and mutually coupled microresonator arrays||Authors:||Tobing, Landobasa Yosef Mario A. L.
Zhang, Dao Hua
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics||Issue Date:||2012||Source:||Tobing, L. Y. M. A. L., Tjahjana, L., & Zhang, D. H. (2012). Characteristics of defect modes in side-coupled and mutually coupled microresonator arrays. Journal of the optical society of America B : optical physics, 29(4), 738-747.||Series/Report no.:||Journal of the optical society of America B: optical physics||Abstract:||We present both theoretically and experimentally the existence of defect modes in side-coupled and mutually coupled microresonator arrays. The qualitative difference between the two types of defect modes is investigated. The Qfactor of both defect modes for varying defect sizes is characterized, and an enhancement of ∼30×relative to individual loaded resonators is demonstrated. The defect modes are then compared with coupled resonator–induced transparency (CRIT), indicating that the defect modes based on side-coupled microresonator arrays are actually the extension of the CRIT resonance in two-resonator structures.||URI:||https://hdl.handle.net/10356/79989
|ISSN:||0740-3224||DOI:||10.1364/JOSAB.29.000738||Rights:||© 2012 Optical Society of America. This paper was published in Journal of the Optical Society of America B: Optical Physics and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: [http://dx.doi.org/10.1364/JOSAB.29.000738]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
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Updated on Jan 22, 2021
Updated on Jan 22, 2021
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