Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/79989
Title: Characteristics of defect modes in side-coupled and mutually coupled microresonator arrays
Authors: Tobing, Landobasa Yosef Mario A. L.
Tjahjana, Liliana
Zhang, Dao Hua
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Issue Date: 2012
Source: Tobing, L. Y. M. A. L., Tjahjana, L., & Zhang, D. H. (2012). Characteristics of defect modes in side-coupled and mutually coupled microresonator arrays. Journal of the optical society of America B : optical physics, 29(4), 738-747.
Series/Report no.: Journal of the optical society of America B: optical physics
Abstract: We present both theoretically and experimentally the existence of defect modes in side-coupled and mutually coupled microresonator arrays. The qualitative difference between the two types of defect modes is investigated. The Qfactor of both defect modes for varying defect sizes is characterized, and an enhancement of ∼30×relative to individual loaded resonators is demonstrated. The defect modes are then compared with coupled resonator–induced transparency (CRIT), indicating that the defect modes based on side-coupled microresonator arrays are actually the extension of the CRIT resonance in two-resonator structures.
URI: https://hdl.handle.net/10356/79989
http://hdl.handle.net/10220/17851
ISSN: 0740-3224
DOI: 10.1364/JOSAB.29.000738
Rights: © 2012 Optical Society of America. This paper was published in Journal of the Optical Society of America B: Optical Physics and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: [http://dx.doi.org/10.1364/JOSAB.29.000738].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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