Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/80081
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dc.contributor.authorShalabney, A.en
dc.contributor.authorAbdulhalim, Ibrahimen
dc.date.accessioned2014-01-24T03:52:37Zen
dc.date.accessioned2019-12-06T13:40:19Z-
dc.date.available2014-01-24T03:52:37Zen
dc.date.available2019-12-06T13:40:19Z-
dc.date.copyright2012en
dc.date.issued2012en
dc.identifier.citationShalabney, A.,& Abdulhalim, I. (2012). Figure-of-merit enhancement of surface plasmon resonance sensors in the spectral interrogation. Optics Letters, 37(7), 1175-1177.en
dc.identifier.urihttps://hdl.handle.net/10356/80081-
dc.description.abstractWe show that adding a thin dielectric layer with high refractive index on top of the metallic layer in surface plasmon resonance sensors in the Kretschmann–Raether configuration in the spectral mode causes a redshift of the resonance wavelength, narrowing of the resonance dip, and an enhancement to the spectral sensitivity. Surprisingly, together with the sensitivity enhancement, the dip becomes much narrower and the figure of merit is considerably improved, particularly in the IR range.en
dc.language.isoenen
dc.relation.ispartofseriesOptics lettersen
dc.rights© 2012 Optical Society of America. This paper was published in Optics Letters and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: [http://dx.doi.org/10.1364/OL.37.001175].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en
dc.subjectMaterials Science and Engineeringen
dc.titleFigure-of-merit enhancement of surface plasmon resonance sensors in the spectral interrogationen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Materials Science & Engineeringen
dc.identifier.doi10.1364/OL.37.001175en
dc.description.versionPublished versionen
item.grantfulltextopen-
item.fulltextWith Fulltext-
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