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dc.contributor.authorBreier, Jakuben
dc.contributor.authorJap, Dirmantoen
dc.identifier.citationBreier, J., & Jap, D. (2015). Testing Feasibility of Back-Side Laser Fault Injection on a Microcontroller. Proceedings of the WESS'15: Workshop on Embedded Systems Security, 5-.en
dc.description.abstractLaser fault attack platform constitutes a powerful tool for a precise injection of faults into the device, allowing an attacker to carefully adjust timing and position on the chip. On the other hand, the cost of such equipment is high and the profiling time is non-negligible. In this paper, we would like to investigate the practicability of the back-side laser fault injection and to state benefits and drawbacks of this technique. We performed experiments on two methods of fault injections induced by a laser beam -- instruction disturbance experiments and register value changes. The first method, as our experiments show, is easy to perform, precise and repeatable. The second one is harder to perform and we could not achieve repeatability in such experiments.en
dc.rights© 2015 Association for Computing Machinery (ACM). This is the author created version of a work that has been peer reviewed and accepted for publication by Proceedings of the WESS'15: Workshop on Embedded Systems Security, Association for Computing Machinery (ACM). It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [].en
dc.subjectFault Attacken
dc.titleTesting Feasibility of Back-Side Laser Fault Injection on a Microcontrolleren
dc.typeConference Paperen
dc.contributor.schoolSchool of Physical and Mathematical Sciencesen
dc.contributor.conferenceProceedings of the WESS'15: Workshop on Embedded Systems Securityen
dc.contributor.researchTemasek Laboratoriesen
dc.description.versionAccepted versionen
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