Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/81176
Title: Study of Surface Potential and Electric Stress on Traction Insulators
Authors: Madhulita, Monali
Reddy B, Subba
Chaudhuri, Tanaya
Keywords: shorted sheds
surtace charge simulation method
surface potential
traction insularors
crack fault
surface field
Issue Date: 2012
Source: Reddy, B. S., Chaudhuri, T., & Madhulita, M. (2012). Study of Surface Potential and Electric Stress on Traction Insulators. International Conference on Advanced Computing and Communication Technologies (ICACCT-2012), 311-314.
Conference: International Conference on Advanced Computing & Communication Technologies (ICACCT) (6th:2012)
Abstract: Optimal performance of traction insulators is essential to ensure reliability of railway traction electrification system. They are exposed to environmental degradation and vandalism due to the overhead erection in railway lines. The likely damages that can take place are cracks in the sheds, or shorting of sheds due to formation of conducting dust and moisture layer on the surface. Fault in one shed increases the stress on the healthy sheds, resulting in an undesirable deviation of the electric field and potential profiles of the insulator from the normal ones, which may also lead to a flashover across the healthy portions. Surface charge simulation method (SCSM) is used to find the potential and electric field for the most widely used traction insulators in the country, and the stress increment is studied. The simulation results obtained for both healthy and fault-imposed insulators are presented, The experimental results of dry and wet withstand tests are presented along with the leakage current performance for the traction insulators.
URI: https://hdl.handle.net/10356/81176
http://hdl.handle.net/10220/40674
URL: https://tanayachaudhuri.files.wordpress.com/2013/12/tanaya_icacct2012.pdf
Schools: School of Electrical and Electronic Engineering 
Organisations: Indian Institute of Science (IISc) Bangalore
Rights: © 2012 IEEE.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Conference Papers

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