Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/81209
Title: Thickness-Induced Metal-Insulator Transition in Sb-doped SnO2 Ultrathin Films: The Role of Quantum Confinement
Authors: Ke, Chang
Zhu, Weiguang
Zhang, Zheng
Tok, Eng Soon
Ling, Bo
Pan, Jisheng
Keywords: Thin films
Issue Date: 2015
Source: Ke, C., Zhu, W., Zhang, Z., Tok, E. S., Ling, B., & Pan, J. (2015). Thickness-Induced Metal-Insulator Transition in Sb-doped SnO2 Ultrathin Films: The Role of Quantum Confinement. Scientific Reports, 5, 17424-.
Series/Report no.: Scientific Reports
Abstract: A thickness induced metal-insulator transition (MIT) was firstly observed in Sb-doped SnO2 (SnO2:Sb) epitaxial ultrathin films deposited on sapphire substrates by pulsed laser deposition. Both electrical and spectroscopic studies provide clear evidence of a critical thickness for the metallic conductivity in SnO2:Sb thin films and the oxidation state transition of the impurity element Sb. With the shrinkage of film thickness, the broadening of the energy band gap as well as the enhancement of the impurity activation energy was studied and attributed to the quantum confinement effect. Based on the scenario of impurity level pinning and band gap broadening in quantum confined nanostructures, we proposed a generalized energy diagram to understand the thickness induced MIT in the SnO2:Sb system.
URI: https://hdl.handle.net/10356/81209
http://hdl.handle.net/10220/39143
ISSN: 2045-2322
DOI: 10.1038/srep17424
Rights: This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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