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Title: Timing Fault Detection in FPGA-Based Circuits
Authors: Stott, Edward
Levine, Joshua M.
Kapre, Nachiket
Cheung, Peter Y. K.
Keywords: Computer Science and Engineering
Issue Date: 2014
Source: Stott, E., Levine, J. M., Cheung, P. Y. K., & Kapre, N. (2014). Timing Fault Detection in FPGA-Based Circuits. 2014 IEEE 22nd Annual International Symposium on Field-Programmable Custom Computing Machines, 96-99.
Conference: 2014 IEEE 22nd Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM)
Abstract: The operation of FPGA systems, like most VLSI technology, is traditionally governed by static timing analysis, whereby safety margins for operating and manufacturing uncertainty are factored in at design-time. If we operate FPGA designs beyond these conservative margins we can obtain substantial energy and performance improvements. However, doing this carelessly would cause unacceptable impacts to reliability, lifespan and yield - issues which are growing more severe with continuing process scaling. Fortunately, the flexibility of FPGA architecture allows us to monitor and control reliability problems with a variety of runtime instrumentation and adaptation techniques. In this paper we develop a system for detecting timing faults in arbitrary FPGA circuits based on Razor-like shadow register insertion. Through a combination of calibration, timing constraint and adaptation of the CAD flow, we deliver low-overhead, trustworthy fault detection for FPGA-based circuits.
DOI: 10.1109/FCCM.2014.32
Schools: School of Computer Engineering 
Rights: © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Conference Papers

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