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Title: Parameter estimation of block and helical scan interleavers in the presence of bit errors
Authors: Swaminathan, Ramabadran
Madhukumar, A. S.
Ng, Wee Teck
See, Chong Meng Samson
Keywords: Blind/semi-blind estimation
Block interleaver
Issue Date: 2016
Source: Swaminathan, R., Madhukumar, A. S., Ng, W. T., & See, C. M. S. (2017). Parameter estimation of block and helical scan interleavers in the presence of bit errors. Digital Signal Processing, 60, 20-32.
Journal: Digital Signal Processing 
Series/Report no.: Digital Signal Processing
Abstract: In data communication and digital storage applications, interleaver, which rearranges the encoded data stream, follows the channel encoder to prevent burst errors. In general, forward error correction (FEC) codes provide protection against randomly distributed errors, whereas interleaver provides protection against error bursts. To de-interleave the interleaved data, accurate information about the interleaver parameters is required at the receiver. However, in non-cooperative context, the parameters are either not known or only partially known at the receiver. Therefore, blind/semi-blind estimation of interleaver parameters is mandatory at the receiver in order to successfully de-interleave the interleaved data. In this context, this paper proposes innovative algorithms for the estimation of interleaver parameters such as interleaver period (or size of the interleaver matrix), number of rows and columns of the interleaver matrix, and helical array step size in the presence of bit errors provided the knowledge of type of interleaver is known at the receiver. In addition, it has been assumed that the block and helical scan interleavers follow a convolutional encoder.
ISSN: 1051-2004
DOI: 10.1016/j.dsp.2016.08.006
Schools: School of Computer Science and Engineering 
Research Centres: Temasek Laboratories 
Rights: © 2016 Elsevier Inc. All rights reserved. This paper was published in Digital Signal Processing and is made available with permission of Elsevier Inc.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Journal Articles
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