Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/81671
Title: A Monolithically Integrated Pressure/Oxygen/Temperature Sensing SoC for Multimodality Intracranial Neuromonitoring
Authors: Chan, Wai Pan
Narducci, Margarita
Gao, Yuan
Cheng, Ming-Yuan
Cheong, Jia Hao
George, Arup K.
Cheam, Daw Don
Leong, Siew Chong
Damalerio, Maria Ramona B.
Lim, Ruiqi
Tsai, Ming-Ling
Rahman, Abdur R. A.
Park, Mi Kyoung
Kong, Zhi Hui
Prashanth, Rao Jai
Je, Minkyu
Keywords: Capacitance to voltage converter (CVC)
capacitive pressure sensor
Issue Date: 2014
Source: Chan, W. P., Narducci, M., Gao, Y., Cheng, M.-Y., Cheong, J. H., George, A. K., et al. (2014). A Monolithically Integrated Pressure/Oxygen/Temperature Sensing SoC for Multimodality Intracranial Neuromonitoring. IEEE Journal of Solid-State Circuits, 49(11), 2449-2461.
Series/Report no.: IEEE Journal of Solid-State Circuits
Abstract: A fully integrated SoC for multimodality intracranial neuromonitoring is presented in this paper. Three sensors including a capacitive MEMS pressure sensor, an electrochemical oxygen sensor and a solid-state temperature sensor are integrated together in a single chip with their respective interface circuits. Chopper stabilization and dynamic element matching techniques are applied in sensor interface circuits to reduce circuit noise and offset. On-chip calibration is implemented for each sensor to compensate process variations. Measured sensitivity of the pressure, oxygen, and temperature sensors are 18.6 aF/mmHg, 194 pA/mmHg, and 2 mV/°C, respectively. Implemented in 0.18 m CMOS, the SoC occupies an area of 1.4 mm × 4 mm and consumes 166 μW DC power. A prototype catheter for intracranial pressure (ICP) monitoring has been implemented and the performance has been verified with ex vivo experiment.
URI: https://hdl.handle.net/10356/81671
http://hdl.handle.net/10220/40917
ISSN: 0018-9200
DOI: 10.1109/JSSC.2014.2345754
Schools: School of Electrical and Electronic Engineering 
Rights: © 2014 IEEE.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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